Samtec is pleased to offer a new service for engineers who are considering our high speed connectors. Building upon the benefits of our Final Inch® reference designs, we now offer on-request laboratory test data for our Final Inch® circuits.

Because of the cut and paste nature of our Final Inch® reference designs, you can be assured that "what you see is what you get". If you are not yet familiar with the philosophies behind Samtec Final Inch®, you can find more information on our Final Inch® Overview.

Eye patterns are often useful for first pass connector suitability determination. With our Agilent PLTS 50 GHz Characterization System, we can obtain eye pattern data for a complete PCB/connector path at any signal rise time or data rate practical for the foreseeable future. To request eye pattern data for any Final Inch® circuit, simply fill out our Final Inch® Request Form or contact our Signal Integrity Group.

Click here to view Samtec's Comparison of Eye Patterns Generated by Synopsis HSPICE and the Agilent PLTS white paper. This document shows that there is good correlation between Samtec's Final Inch® HSPICE simulated eye patterns to eye patterns processed from S-parameter data measured with Samtec's new Agilent PLTS 50 GHz High Speed Characterization System. Samtec QPairs® QTE-DP/QSE-DP Final Inch® simulations were used as the test article.

In addition to eye patterns, the PLTS system also allows us to provide a vast array of characterization data in both the time and frequency domain as well as in differential and single-ended conditions. For more information about the type of data available from the Agilent PLTS 50 GHz Characterization System, see Agilent Physical Layer Test Systems document version 3.0.