gEEk spEEk – Dual Reverberation Cavities for I/O Connector EMI Performance

Presented by: Gary Biddle Techniques using mode tuned resonant cavities to establish known field levels has enabled the EMC community to construct international immunity and emission test standards. IEC 61000-4 details methodology for testing electronic equipment in large reverberation chambers [LRC] to certify and predict device EMI performance in the free space environment. A relatively new method, dual reverberation cavities [DRC], offers the unique advantage of determining the electromagnetic power transfer through a passive device under test [DUT]. DRC integrates immunity and emission mode tuned techniques to evaluate a DUT mounted in an adjoining bulkhead. Results of connector IO product can be expressed in terms of screening effectiveness [ScrEff]. The presentation shows supporting mode tuned techniques and hardware, along with connector IO test results to 40 GHz.