Geek Speek Webinar – Impedance Corrected De-Embedding

Presented by: Stefaan Sercu To perform accurate measurements of devices, quite often a test-fixture is needed which connects the ports of the device under test with the measurement equipment. The consequence is that the performance of the test-fixture is also included in the measurement results. In this webinar, different methods will be discussed to de-embed the test-fixture performance from the measurement results. More specifically, the differences between a standard 2x thru and an impedance corrected 2x thru technique will be highlighted.

(This is the second in a series of blogs, from Sandeep Sankararaman, Samtec’s Principal RF and Signal Integrity Engineer, discussing design strategies for high-bandwidth RF launches. The first is entitled “What Is An RF Connector Launch?” The third, coming next week, discusses GN...
If you’ve been paying attention to the Coming Soon section in our most recent web updates, you might have noticed we have been working on an upgraded Checkout system for the website for the last several months. We’re happy to announce that this application is now accepting orders...
As signal speeds increase, each part of the signal path getting to and from the device needs to work to higher frequencies.  Strategies that worked in the past no longer suffice and cheaper connectors no longer make the cut. Cable lengths and trace lengths need to get shorter to ...
This month, we released a major new version of our Checkout to a beta state, made some upgrades to how we show lead times online, made 3D model downloads easier from the Search, and released a few more content updates. Here are the major website updates to Samtec.com for July 202...
Something occurred to me recently. AI hardware system architectures are really applications-specific. Computing platforms from laptops, desktops, workstations and servers follow classical architectures. Inputs, outputs, a central processing unit, busses (control, data and memory)...