Webinar: Impedance Corrected De-Embedding

Presented by: Stefaan Sercu To perform accurate measurements of devices, quite often a test-fixture is needed which connects the ports of the device under test with the measurement equipment. The consequence is that the performance of the test-fixture is also included in the measurement results. In this webinar, different methods will be discussed to de-embed the test-fixture performance from the measurement results. More specifically, the differences between a standard 2x thru and an impedance corrected 2x thru technique will be highlighted.