网络研讨会：已纠正阻抗的去嵌入
网络研讨会：已纠正阻抗的去嵌入
演讲人：Stefaan Sercu 为了对设备进行精确的测量，通常需要使用测试夹具将受测设备的端口与测量设备连接。其结果是测试夹具的性能因素也包含在了测量结果中。在本次网络研讨会中，我们将讨论从测量结果中去除测试夹具性能因素的不同方法。更具体地说，是着重讨论标准2倍直通和阻抗校正2倍直通技术之间的差异。
Has there ever been a better time to be an engineer? While the world remains an uncertain place and component shortages have been with us for a few years, modern […]
The post Hardware Pioneers 2024 appeared first on The Samtec Blog....
In all of our Solutionator® tools where users can design a mated set of products, we have now added a feature that allows users to require that BOTH parts be […]
The post You Can Now Search Full Mated Sets Using These New Samtec Reserve® Filters appeared first on The Samtec Blog....
A few of us recently had the privilege of traveling to the 27th Annual Components for Military & Space Electronics Conference & Exhibition. For those who don’t necessarily work in these […]
The post Unlocking Next-Level Reliability: Explore Lot Screen Testing with Samtec appeared...
When researching women in electronics for a previous blog, I had way too much material to share. So here is a follow-on post that offers a summary of some interesting […]
The post Women in Electronics: Technology Giants & Inventors appeared first on The Samtec Blog....
As we continue to work on a major overhaul to our navigation and back-end systems of the website, we were still able to make progress on a few key updates […]
The post Here are the April 2024 Samtec Website Updates appeared first on The Samtec Blog....
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