Tests für harte Umgebungsbedingungen (SET)

Tests für harte Umgebungsbedingungen (SET)

Severe Environment Testing (SET) is a Samtec initiative to test certain products beyond typical industry standards and specifications, many of which are common requirements for harsh environment applications/industries.

Driven by demands for high functioning commercial standard interconnects, SET has proven beneficial in providing performance confidence, not only for rugged Mil/Aero industries and applications, but also for Automotive, Industrial and Medical applications.

severe environment testing video
Industries and Applications

Testing Specifications

Samtec interconnects are subject to a wide variety of standard test procedures that push the industry limits to help ensure quality and durability in any application. Severe Environment Testing includes Samtec’s standard Design Qualification Testing (DQT) and Extended Life Product (E.L.P.) testing, along with additional testing for interconnect systems that will be used in more extreme/harsh applications or environments.

Die SET-Produkte von Samtec sind für NASA-Missionen der Klasse D zugelassen, die hochzuverlässige, schnelle und kostengünstige Lösungen für LEO-Satelliten, SmallSats, CubeSats und andere Anwendungen in der Weltraumforschung erfordern.

Samtec utilizes NASA outgassing data to determine if certain products meet NASA’s ASTM E595-77/84/90 test requirements. See Samtec’s Outgassing FAQ for more information.

Additional Tests Included with SET:

  • VITA 47.1 Moduleinsätze
  • VITA 47.3 Feuchtigkeit
  • VITA 47.1 Betriebssystem-Elektroschockklasse OS2
  • VITA 47.1 Vibrationsklasse VS3

  • Übertrifft VITA 47.1 Temperatur-Zyklus-Klasse C4
  • Übertrifft VITA 47.1 Nicht-Betriebstemperaturklasse C4
  • VITA 47.1 Widerstand gegen elektrostatische Entladung​​​​​​​
  • Übertrifft VITA 47.1 Flughöhe für DWV​​​​​​​

Produkt-Prüfhandbuch

Produkt-Prüfhandbuch

PDF herunterladen

SET Qualified Products

Samtec offers an extensive portfolio of cost-effective interconnect solutions engineered for rugged environments. All testing is completed in-house and can be customized upon request for specific application requirements. Kontakt [E-Mail geschützt] for additional details and available test results.

Tiger Eye 1.27 mm Pitch Micro
Rugged System
SFM TFM
SEARAY 1.27 mm Pitch
Kompakte Arrays
SEAF SEAM
Razor Beam 0.50 mm Pitch
Hermaphroditic Strips
LSHM
.100" (2.54 mm) Pitch Square
Post Header & Socket
SMM TSM
.050" (1.27 mm) Pitch Header &
Socket System
CLP FTSH
Edge Rate® 0.80 mm Pitch
Rugged High-Speed Strips
ERF8 ERM8
Tiger Eye™
2.00 mm Pitch
Rugged System
S2M T2M
mPOWER® 2.00 mm Pitch
Ultra Micro Power
Steckverbinder
QRF8 QRM8
SEARAY 0.80 mm Pitch
Ultra-High Density Open-Pin-
Field Arrays
SEAF8 SEAM8
URSA™ I/O 1.00 mm Pitch
Ultra Rugged I/O System
URSA I/O 1 mm Pitch Ultra Rugged I/O System
Tiger Eye™ .050" Pitch Discrete
Wire Cable Assembly
Tiger Eye DW
Micro Mate 1.00 mm Pitch
Einzelader-Kabelkonfektion
1MMDW
Coming Soon!
High-Speed Micro Coax &
Twinax Cable Assemblies
High-Speed Micro Coax
Coming Soon!
FireFly Copper
Micro Flyover System
ECUO
Coming Soon!

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